The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2008
Filed:
Apr. 25, 2007
Jorg Kraus, Lindau, DE;
Johannes Edlinger, Feldkirch, AT;
Max Wiki, Zurich, CH;
Heidi Thome-forster, Azmoos, CH;
Claus Heine-kempkens, Chur, CH;
Bernd Maisenhoelder, Zurich, CH;
Martin Kaspar, Mels, CH;
Jorg Kraus, Lindau, DE;
Johannes Edlinger, Feldkirch, AT;
Max Wiki, Zurich, CH;
Heidi Thome-Forster, Azmoos, CH;
Claus Heine-Kempkens, Chur, CH;
Bernd Maisenhoelder, Zurich, CH;
Martin Kaspar, Mels, CH;
OC Oerlikon Balzers AG, Balzers, LI;
Abstract
A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL·nL=(2N+1)·¼ wherein dL is a physical thickness of layer L, nL is an index of refraction of layer L at the first wavelength, N is an integer equal to or greater than zero and 1 is the first wavelength. Thicknesses of the layers ensure that any fluorescent sample material disposed on top of said multilayer interference coating would be located near an antinode of a standing wave formed by the excitation light with the first wavelength incident on said substrate.