The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2008
Filed:
Mar. 20, 2006
Applicants:
Sunil Gupta, Austin, TX (US);
Reed Linde, El Dorado Hills, CA (US);
Rich Fackenthal, Carmichael, CA (US);
Inventors:
Sunil Gupta, Austin, TX (US);
Reed Linde, El Dorado Hills, CA (US);
Rich Fackenthal, Carmichael, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus, a method and a system to test a device. An input/output (I/O) block communicates with an external tester to receive test data and to send test result using first and second communication modes. A logic block parses the test data. A memory stores microcode from the parsed test data. The microcode contains a test program to test a circuit. A controller executes the test program.