The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
Jul. 27, 2004
David L. Demaris, Austin, TX (US);
Mark A. Lavin, Katonah, NY (US);
William C. Leipold, Enosburg Falls, VT (US);
Daniel N. Maynard, Craftsbury Common, VT (US);
Maharaj Mukherjee, Wappingers Falls, NY (US);
David L. DeMaris, Austin, TX (US);
Mark A. Lavin, Katonah, NY (US);
William C. Leipold, Enosburg Falls, VT (US);
Daniel N. Maynard, Craftsbury Common, VT (US);
Maharaj Mukherjee, Wappingers Falls, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of synthesizing layout patterns to test an optical proximity correction algorithm. The method comprises the steps of: embodying Walsh patterns in a set of Walsh pattern matrices; processing groups of matrices from the set of Walsh pattern matrices to form a set of test matrices; mapping the set of test matrices to a test pattern set.