The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
Oct. 05, 2006
Robert J. Allen, Jericho, VT (US);
Evanthia Papadopoulou, New York, NY (US);
Mervyn Yee-min Tan, S. Burlington, VT (US);
Robert J. Allen, Jericho, VT (US);
Evanthia Papadopoulou, New York, NY (US);
Mervyn Yee-Min Tan, S. Burlington, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Disclosed is a method that determines critical areas associated with different types of fault mechanisms in an integrated circuit design. The invention does this by constructing individual Voronoi diagrams for critical areas of individual fault mechanisms and a composite Voronoi diagram based on the individual Voronoi diagrams. The invention computes the critical area for composite fault mechanisms of the integrated circuit design based on the composite Voronoi diagram.