The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
Aug. 23, 2002
Steven M. Arrivo, Ann Arbor, MI (US);
William E. Bowen, Ambler, PA (US);
Robert A. Reed, Line Lexington, PA (US);
John P. Higgins, Lansdale, PA (US);
Steven M. Arrivo, Ann Arbor, MI (US);
William E. Bowen, Ambler, PA (US);
Robert A. Reed, Line Lexington, PA (US);
John P. Higgins, Lansdale, PA (US);
Merck & Co. Inc., Rahway, NJ (US);
Abstract
The present invention provides methods for the use of visible and/or near-infrared spectroscopic methodology to monitor and control processes for the generation of particles, including processes that provide for a reduction in particle size and processes that result in an increase in particle size. One embodiment of the present invention employs visible and/or near-infrared diffuse reflectance spectroscopy to monitor particle size. The present invention is particularly useful for monitoring particle size of optically dense samples and is further useful for monitoring the endpoint of particle generation processes. In contrast to methods known in the art, the present invention is especially useful for on-line monitoring of particle size.