The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2008
Filed:
Mar. 01, 2007
Applicants:
Shigenori Tsuji, Tokyo, JP;
Yohsuke Yoshinari, Tokyo, JP;
Masahiro Shirakawa, Kyoto, JP;
Tetsuro Kobubo, Kanagawa, JP;
Inventors:
Shigenori Tsuji, Tokyo, JP;
Yohsuke Yoshinari, Tokyo, JP;
Masahiro Shirakawa, Kyoto, JP;
Tetsuro Kobubo, Kanagawa, JP;
Assignee:
Jeol Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A magnetic resonance force microscope (MRFM) generator for producing an RF magnetic field uniformly over the whole of a sample. A cantilever with magnetic probe tip is self-excited. Under this condition, spins in the sample are controlled to produce a magnetic resonance force. A frequency demodulator measures the resonant frequency of the cantilever from the output detection signal from a cantilever displacement-measuring instrument based on the magnetic resonance force.