The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2008

Filed:

Jan. 19, 2005
Applicants:

Hidefumi Ibe, Yokohama, JP;

Yasuo Yahagi, Tokyo, JP;

Hideaki Kameyama, Uenohara, JP;

Inventors:

Hidefumi Ibe, Yokohama, JP;

Yasuo Yahagi, Tokyo, JP;

Hideaki Kameyama, Uenohara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Spectrum data of white neutrons having different spectrum shapes, and SEE counts obtained by a white neutron method using this multiple spectrum data, are stored. A computing section reads out the spectrum data, divides the data into energy groups, and calculates and stores a total flux of each energy group. Furthermore, the computing section reads out the SEE counts with respect to each of the spectrum data and the total flux of each energy group, substitutes the SEE counts and the total flux into a simultaneous equation, and calculates the SEE cross section for each of the energy groups. Subsequently, the computing section calculates parameters which determine a formula of the approximate function of the SEE cross section as a function of energy, so that computed values of error counts obtained by integration of multiple spectra and the approximate function sufficiently match the actual measured values thereof.


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