The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2008
Filed:
Jun. 30, 2000
Peter Schwarz, Geretsried, DE;
Uwe Sperling, Geretsried, DE;
Peter Schwarz, Geretsried, DE;
Uwe Sperling, Geretsried, DE;
BYK-Gardner GmbH, Geretsried, DE;
Abstract
The present invention relates to a device and method for making quantified determinations of the quality of surfaces and wherein the device comprises an optical system with a first optical means and a second optical means as well as a control and evaluation means and an output (display) means. Said first optical means comprises an illuminating means having at least one LED as its light source and serves the function of illuminating the measurement surface at a predetermined angle. Said second optical means is likewise directed at a predetermined angle to the measurement surface and receives the reflected light. A photo sensor of said second optical means emits an electrical measurement signal which is characteristic of said reflected light. The light emitted from the illuminating means is configured such that its spectral characteristic comprises blue, green and red spectral components in the visible light spectrum. A filter means is arranged in the path of radiation between the light source and the photo sensor and which changes the spectral characteristics of the incident light so as to approach a predetermined spectral distribution. The control and evaluation means control the measurement sequence and evaluate the reflected light, deriving therefrom at least one parameter which is characteristic of the surface.