The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2008

Filed:

Nov. 12, 2003
Applicants:

Sharon Duvdevani, Mazkeret Batya, IL;

Tally Gilat-bernshtein, Yavne, IL;

Eyal Klingbell, Rehovot, IL;

Meir Mayo, Rehovot, IL;

Shmuel Rippa, Ramat Gan, IL;

Zeev Smilansky, Meishar, IL;

Inventors:

Sharon Duvdevani, Mazkeret Batya, IL;

Tally Gilat-Bernshtein, Yavne, IL;

Eyal Klingbell, Rehovot, IL;

Meir Mayo, Rehovot, IL;

Shmuel Rippa, Ramat Gan, IL;

Zeev Smilansky, Meishar, IL;

Assignee:

Orbotech Ltd., Yavne, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/48 (2006.01); G06K 9/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electrical circuit inspection method including, for each of a plurality of types of local characteristics, each type occurring at least once within electrical circuitry to be inspected, identifying at least one portion of interest within the electrical circuitry whereat the local characteristic is expected to occur, and inspecting an image of each portion of interest, using an inspection task selected in response to the type of local characteristic expected to occur in the portion of interest.


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