The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2008
Filed:
Oct. 20, 2005
Jon Udell, West Linn, OR (US);
Chen Wang, Tigard, OR (US);
Mark Kassab, Wilsonville, OR (US);
Janusz Rajski, West Linn, OR (US);
Jon Udell, West Linn, OR (US);
Chen Wang, Tigard, OR (US);
Mark Kassab, Wilsonville, OR (US);
Janusz Rajski, West Linn, OR (US);
Other;
Abstract
Described herein are methods and systems for distributed execution of circuit testing algorithms, or portions thereof. Distributed processing can result in faster processing. Algorithms or portions of algorithms that are independent from each other can be executed in a non-sequential manner (e.g., parallel) over a network of plurality of processors. The network includes a controlling processor that can allocate tasks to other processors and conduct the execution of some tasks on its own. Dependent algorithms, or portions thereof, can be performed on the controlling processor or one of the controlled processors in a sequential manner.