The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2008
Filed:
Sep. 29, 2004
Qian Diao, Beijing, CN;
Qian Diao, Beijing, CN;
Intel Corporation, Santa Clara, CA (US);
Abstract
A method, apparatus, and system are provided for k-means clustering using t-test computation. According to one embodiment, k-means clustering is performed on a dataset. In performing k-means clustering, the dataset having various points is partitioned into several clusters. The closeness of a given point to a given cluster is determined. Then, t-test computation is performed to determine statistical linear relationship between the point and the cluster. If the point is found to be close to the cluster and a statistical linear relationship is found between the point and the cluster, the current position of the point is maintained.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile