The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2008

Filed:

May. 20, 2004
Applicants:

John A. Woollam, Lincoln, NE (US);

Corey L. Bungay, Lincoln, NE (US);

Thomas E. Tiwald, Lincoln, NE (US);

Martin M. Liphardt, Lincoln, NE (US);

Ronald A. Synowicki, Lincoln, NE (US);

Gregory K. Pribil, Lincoln, NE (US);

Craig M. Herzinger, Lincoln, NE (US);

Blaine D. Johs, Lincoln, NE (US);

James N. Hilfiker, Lincoln, NE (US);

Inventors:

John A. Woollam, Lincoln, NE (US);

Corey L. Bungay, Lincoln, NE (US);

Thomas E. Tiwald, Lincoln, NE (US);

Martin M. Liphardt, Lincoln, NE (US);

Ronald A. Synowicki, Lincoln, NE (US);

Gregory K. Pribil, Lincoln, NE (US);

Craig M. Herzinger, Lincoln, NE (US);

Blaine D. Johs, Lincoln, NE (US);

James N. Hilfiker, Lincoln, NE (US);

Assignee:

J.A. Woollam Co., Inc., Lincoln, NE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.


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