The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2008
Filed:
Jan. 06, 2003
Rajarshi Mukherjee, San Jose, CA (US);
Toshiya Mima, Kanagawa, JP;
Yozo Nakayama, Kanagawa, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A method and system for element testing is described. A first module is generated and has at least one associated state. A second module is generated based on the first module. The second module is associated with a test element. The test element is controlled based on the second module and the states, and the test element is applied to a design-under-test. Data flow information, determined while applying the test element to the design-under-test, is store in a transaction database, and the data items read and modified by the data flow information are stored in a data database. At least one result is determined based on the application of the test element to the design-under-test.