The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2008
Filed:
Jul. 24, 2006
Darren L. Anand, Essex Junction, VT (US);
Nazmul Habib, South Burlington, VT (US);
Robert J. Mcmahon, Essex Junction, VT (US);
Troy J. Perry, Georgia, VT (US);
Darren L. Anand, Essex Junction, VT (US);
Nazmul Habib, South Burlington, VT (US);
Robert J. McMahon, Essex Junction, VT (US);
Troy J. Perry, Georgia, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system for performing device-specific testing and acquiring parametric data on custom integrated circuits, for example ASICs, such that each chip is tested individually without excessive test time requirements, additional silicon, or special test equipment. The testing system includes a device test structure integrated into unused backfill space in an ASIC design which tests a set of dummy devices that are identical to some of those of the ASIC. The device test structure includes control logic for designating the type of test and which device types to activate (e.g. pFETs or nFETs), a protection circuit for protecting the SPM when the test is inactive, an isolation circuit for isolating the devices under test (DUT) from any leakage current during test, and a decode circuit for providing test input (e.g. voltages) to the DUT. By controlling which devices to test and the voltage conditions of those devices, the system calculates the relative product yield and health of the line on a die by die basis.