The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2008
Filed:
Sep. 22, 2006
Erik Volkerink, San Jose, CA (US);
Duncan Gurley, San Jose, CA (US);
Ajay Khoche, San Jose, CA (US);
Erik Volkerink, San Jose, CA (US);
Duncan Gurley, San Jose, CA (US);
Ajay Khoche, San Jose, CA (US);
Verigy (Singapore) Pte. Ltd., Singapore, SG;
Abstract
A wafer test head and ATE for testing semiconductor wafers. The wafer test head having a plurality of sides that can each be used to test a different semiconductor wafer. The architecture of the wafer test head enables electrical connections to probe card located on two different sides of the wafer test head. Multiple silicon wafers can be tested for proper functionality at the same time or in an interleaved fashion via a single multi-sided wafer test head. The internal architecture of an exemplary wafer test head allows printed circuit cards to be able to electrically connected to multiple wafer test locations on a single wafer test head.