The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2008
Filed:
Nov. 22, 2004
Takashi Noda, Utsunomiya, JP;
Katsuyuki Ogura, Utsunomiya, JP;
Takashi Noda, Utsunomiya, JP;
Katsuyuki Ogura, Utsunomiya, JP;
Mitutoyo Corporation, Kawasaki-shi, JP;
Abstract
A measuring system includes a coordinate measuring machine for driving a scanning probe and a host computer. The host computer includes a compensation table () and a profile analysis unit (). The compensation table stores, as compensation data, compensation coefficients to correct counter values of a probe counter (), and compensation radiuses 'r' to the workpiece surface concerning central coordinate values of a contact portion, for respective contact directions. The profile analysis unit has a contact direction calculation unit (), a compensation data selection unit (), a compensation calculation unit (). The contact direction calculation unit calculates the contact direction along which the scanning probe comes into contact with a workpiece W, and the compensation data selection unit selects compensation data set up in the compensation table based on thus calculated contact direction.