The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2008
Filed:
Nov. 18, 2005
Scott M. Carlson, Tucson, AZ (US);
Greg A. Dyck, Morgan Hill, CA (US);
Tan LU, Poughkeepsie, NY (US);
Kenneth J. Oakes, Wappingers Falls, NY (US);
Dale F. Riedy, Jr., Poughkeepsie, NY (US);
William J. Rooney, Hopewell Junction, NY (US);
John S. Trotter, Pleasant Valley, NY (US);
Leslie W. Wyman, Poughkeepsie, NY (US);
Harry M. Yudenfriend, Poughkeepsie, NY (US);
Scott M. Carlson, Tucson, AZ (US);
Greg A. Dyck, Morgan Hill, CA (US);
Tan Lu, Poughkeepsie, NY (US);
Kenneth J. Oakes, Wappingers Falls, NY (US);
Dale F. Riedy, Jr., Poughkeepsie, NY (US);
William J. Rooney, Hopewell Junction, NY (US);
John S. Trotter, Pleasant Valley, NY (US);
Leslie W. Wyman, Poughkeepsie, NY (US);
Harry M. Yudenfriend, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An Input/output (I/O) measurement block facility is provided that creates subchannel measurement blocks (comprising device busy values) related to performance of an I/O operation of a subchannel, wherein a device busy time value is a sum of time intervals when the subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel.