The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2008
Filed:
Jul. 31, 2002
Xiaofen Chen, West Linn, OR (US);
Xiaofen Chen, West Linn, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A fault severity check and source identification method for a frequency domain instrument accesses acquired reflection data for a transmission line under test. From the acquired data reflection surfaces are isolated as a function of distance. Each reflection surface is examined to produce a frequency response profile and a worst-case reflection response to determine fault severity. The frequency response profile may also be correlated in a pattern recognition algorithm with known reference source profiles to determine the source identification for the fault.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile