The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2008

Filed:

Apr. 08, 2005
Applicants:

Richard Schultz, Fort Collins, CO (US);

Gerald Shipley, Hillsboro, OR (US);

Derryl Allman, Camas, WA (US);

Inventors:

Richard Schultz, Fort Collins, CO (US);

Gerald Shipley, Hillsboro, OR (US);

Derryl Allman, Camas, WA (US);

Assignee:

LSI Logic Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H01L 23/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for collecting and analyzing integrated circuit test vehicle test data by identifying various blocks of circuitry through at least two different intersecting test paths. In one embodiment, the process test circuits may be arranged in a matrix format and connected so that they may be tested along rows or columns. When a failure along a specific row and a specific column is identified, the process test circuit at the intersection may be identified as the failure point.


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