The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2008

Filed:

Oct. 23, 2003
Applicants:

Benoit Nadeau-dostie, Gatineau, CA;

Jean-françois Côté, Chelsea, CA;

Inventors:

Benoit Nadeau-Dostie, Gatineau, CA;

Jean-François Côté, Chelsea, CA;

Assignee:

LogicVision, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and circuit for collecting memory failure information on-chip and unloading the information in real time while performing a test of memory embedded in a circuit comprises, for each column or row of a memory under test, testing each memory location of the column or row according to a memory test algorithm under control of a first clock, selectively generating a failure summary on-circuit while testing each column or row of the memory; and transferring the failure summary from the circuit under control of a second clock within the time required to test the next column or row, if any, of the memory under test.


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