The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2008

Filed:

Jun. 18, 2004
Applicants:

Tadahiro Ohmi, Komegahukuro 2-chome, Aoba-ku, Sendai-shi, Miyagi 9800813, JP;

Kazuhiko Sugiyama, Yamanashi, JP;

Tomio Uno, Osaka, JP;

Nobukazu Ikeda, Osaka, JP;

Kouji Nishino, Osaka, JP;

Osamu Nakamura, Osaka, JP;

Ryousuke Dohi, Osaka, JP;

Atsushi Matsumoto, Osaka, JP;

Inventors:

Tadahiro Ohmi, Komegahukuro 2-chome, Aoba-ku, Sendai-shi, Miyagi 9800813, JP;

Kazuhiko Sugiyama, Yamanashi, JP;

Tomio Uno, Osaka, JP;

Nobukazu Ikeda, Osaka, JP;

Kouji Nishino, Osaka, JP;

Osamu Nakamura, Osaka, JP;

Ryousuke Dohi, Osaka, JP;

Atsushi Matsumoto, Osaka, JP;

Assignees:

Fujikin Incorporated, Osaka-shi, JP;

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/37 (2006.01);
U.S. Cl.
CPC ...
Abstract

A differential pressure type flowmeter comprises an orifice, a detector to detect a fluid pressure Pon the upstream side of an orifice, a detector to detect a fluid pressure Pon the downstream side of an orifice, a detector to detect a fluid temperature T on the upstream side of an orifice, and a control computation circuit to compute a fluid's flow rate Q passing through an orifice by using the pressure P, where Pand temperature T detected with the aforementioned detectors, and the aforementioned fluid's flow rate Q is computed with the equation(()−())(where Cis a proportional constant, and m and n are constants).


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