The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2008

Filed:

Nov. 06, 2006
Applicants:

Tomonori Goto, Sapporo, JP;

Toshiyuki Tamai, Sapporo, JP;

Inventors:

Tomonori Goto, Sapporo, JP;

Toshiyuki Tamai, Sapporo, JP;

Assignee:

Mitutoyo Corporation, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A form measuring instrument comprising: a roughness sensor placed on the table, and for outputting measurement data that includes information on the cross-sectional shape; a relative movement mechanism for relatively moving the table and the roughness sensor such that the position of the roughness sensor on the workpiece is relatively moved along the surface to be evaluated, and for outputting the amount of relative movement at a movement resolution Δθ as indexed-movement-amount information; a time sampler for sampling the measurement data output from the roughness sensor, at a constant time interval t; and a data processing mechanism for converting the measurement data sampled at the constant time interval tby the time sampler to measurement data having a fixed interval according to the indexed-movement-amount information output from the relative movement mechanism.


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