The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Dec. 09, 2005
Masaru Doi, Tokyo, JP;
Shinya Sato, Tokyo, JP;
Masaru Doi, Tokyo, JP;
Shinya Sato, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A testing apparatus for testing a memory-under-test includes a writing section for writing preset test data into each page of said memory-under-test to test said memory-under-test and a fail memory unit for storing the test result of said memory-under-test. The fail memory unit includes a write time measuring section for measuring a write time required for writing said test data per each of said pages, an integrating section for integrating said write time across a plurality of said pages set in advance, and a judging section for judging whether or not said memory-under-test is defect-free by comparing a value integrated by said integrating section with an expected value set in advance. The integrating section further integrates said write time per page group having said predetermined number of pages. The judging section further judges whether or not said page group is defect-free based on an integral value of said write time per said page group.