The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2008

Filed:

Jun. 27, 2005
Applicants:

Sion Berkowits, Haifa, IL;

Orna Etzion, Haifa, IL;

LI Jianhui, Shanghai, CN;

Inventors:

Sion Berkowits, Haifa, IL;

Orna Etzion, Haifa, IL;

Li Jianhui, Shanghai, CN;

Assignee:

Intel Corporation, Santa Clara, unknown;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/38 (2006.01); G06F 9/455 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method may translate a set of source instructions into a set of target instructions, execute the set of target instructions, and unmask a denormal input control bit if the set of source instructions uses a denormal input handling mechanism. A method may detect at least one denormal exception of a faulty target instruction by executing the set of target instructions; assign a predetermined value to one or more denormal operands of the faulty target instruction; and execute the faulty target instruction with the predetermined value for the one or more denormal operands. An apparatus, system, and machine-readable medium may perform such methods.


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