The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Dec. 23, 2005
Kamran Zaman, Pittsford, NY (US);
Dante Pietrantoni, Rochester, NY (US);
Ken Gottschalk, West Henrietta, NY (US);
Stanley Pietrzykowski, Brighton, NY (US);
Kamran Zaman, Pittsford, NY (US);
Dante Pietrantoni, Rochester, NY (US);
Ken Gottschalk, West Henrietta, NY (US);
Stanley Pietrzykowski, Brighton, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
An apparatus and a method for detecting low frequency specular surface flaws on coated substrates is disclosed. A method for detecting low frequency specular surface flaws may comprise: impinging visible electromagnetic radiation or light from an electromagnetic radiation source onto the coated substrate at an oblique angle, reflecting the visible electromagnetic radiation off the coated substrate onto a screen material to form a specular surface flaw reflected image, and recording the reflected image off the screen material with a photosensitive device to form a recorded reflected image.