The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2008

Filed:

Apr. 28, 2005
Applicants:

Jun Liu, Brookfield, CT (US);

Mackenzie King, Southbury, CT (US);

Michael Darsillo, Woodbury, CT (US);

Karl E. Boggs, Hopewell Junction, NY (US);

Jeffrey F. Roeder, Brookfield, CT (US);

Thomas H. Baum, New Fairfield, CT (US);

Inventors:

Jun Liu, Brookfield, CT (US);

Mackenzie King, Southbury, CT (US);

Michael Darsillo, Woodbury, CT (US);

Karl E. Boggs, Hopewell Junction, NY (US);

Jeffrey F. Roeder, Brookfield, CT (US);

Thomas H. Baum, New Fairfield, CT (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01); H01L 21/461 (2006.01);
U.S. Cl.
CPC ...
Abstract

A CMP composition containing 5-aminotetrazole, e.g., in combination with oxidizing agent, chelating agent, abrasive and solvent and a method of use. Such CMP composition may be diluted during the CMP polish to minimize the occurrence of dishing or other adverse planarization deficiencies in the polished copper, even in the presence of substantial levels of copper ions in the CMP composition and at the copper/CMP composition interface during CMP processing.


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