The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2008

Filed:

Mar. 14, 2005
Applicant:

Rong-hwa Ding, Jubei, TW;

Inventor:

Rong-Hwa Ding, Jubei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measure system for signal measurement is introduced. The measure system simplifies the effort for a signal measurement in many applications. The application for a signal measurement is, for example, computation of a signal average value. The measure system includes a digital computation circuit together with an analog to digital converter (ADC) to constitute a compact signal measurement component. With the proposed design, a general microcontroller can proceed with a signal level sense and control with very few CPU power. In addition, the proposed system can be integrated with other analog or digital signal processing circuitry to form a single silicon chip.


Find Patent Forward Citations

Ding, Rong-Hwa. (2008). Data processing apparatus and scheme for signal measurement (U.S. Patent No. 7359839). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7359839

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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