The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
Dec. 22, 2006
Deh Ming Shyu, Miaoli County, TW;
Chun Hung Ko, Changhua County, TW;
Yi Sha Ku, Hsinchu, TW;
Nigel Smith, Hsinchu, TW;
Deh Ming Shyu, Miaoli County, TW;
Chun Hung Ko, Changhua County, TW;
Yi Sha Ku, Hsinchu, TW;
Nigel Smith, Hsinchu, TW;
Industrial Technology Research Institute, Hsinchu County, TW;
Accent Optical Technologies, Inc., Bend, OR (US);
Abstract
A method for inspecting a grating biochip comprises the steps of irradiating a grating biochip using a light beam, measuring a diffracted light using a photodetector, selecting a plurality of parameters of the grating biochip, and optimizing the parameters to enhance the detection sensitivity, wherein the diffracted light is generated by the light beam passing the grating biochip. The grating biochip comprises a grating structure including a semiconductor substrate, a grating positioned on the semiconductor substrate and a dielectric layer covering the grating and the semiconductor substrate. The sample of the biochip is positioned on the grating structure.