The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
Jan. 31, 2006
Kenji Motohashi, Kanagawa, JP;
Hideji Miyanishi, Kanagawa, JP;
Kazumasa Aoki, Tokyo, JP;
Toshinobu Shoji, Kanagawa, JP;
Kikuo Kazama, Kanagawa, JP;
Kenji Motohashi, Kanagawa, JP;
Hideji Miyanishi, Kanagawa, JP;
Kazumasa Aoki, Tokyo, JP;
Toshinobu Shoji, Kanagawa, JP;
Kikuo Kazama, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A testing method for measuring electromagnetic interference of a noise on a to-be-tested printed circuit board, has the steps of: a) injecting a signal simulating an expected noise of a predetermined device mounted on the to-be-tested printed circuit board, into the to-be-tested printed circuit board, in a condition in which at least the predetermined device is not actually mounted on the to-be-tested printed circuit board; and b) measuring electromagnetic interference of the signal.