The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2008
Filed:
Mar. 17, 2005
David William Boerstler, Round Rock, TX (US);
Eskinder Hailu, Austin, TX (US);
Byron Lee Krauter, Round Rock, TX (US);
Kazuhiko Miki, Round Rock, TX (US);
Jieming Qi, Austin, TX (US);
David William Boerstler, Round Rock, TX (US);
Eskinder Hailu, Austin, TX (US);
Byron Lee Krauter, Round Rock, TX (US);
Kazuhiko Miki, Round Rock, TX (US);
Jieming Qi, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Toshiba America Electronics Components, Inc., Irvine, CA (US);
Abstract
A method, an apparatus, and a computer program are provided to measure and/or correct duty cycles. Duty cycles of various signals, specifically clocking signals, are important. However, measurement of very high frequency signals, off-chip, and in a laboratory environment can be very difficult and present numerous problems. To combat problems associated with making off-chip measurements and adjustments of signal duty cycles, comparisons are made between input signals and divided input signals that allow for easy measurement and adjustment of on-chip signals, including clocking signals.