The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2008
Filed:
Sep. 14, 2004
Masato Haruta, Saitama, JP;
Hiroyuki Sato, Gunma, JP;
Takeshi Tanabe, Saitama, JP;
Yoshikazu Nakayama, Saitama, JP;
Masato Haruta, Saitama, JP;
Hiroyuki Sato, Gunma, JP;
Takeshi Tanabe, Saitama, JP;
Yoshikazu Nakayama, Saitama, JP;
ADVANTEST Corporation, Tokyo, JP;
Abstract
A measurement system for circuit parameters of a device under test (DUT) that reduces the number of attachments and detachments of calibration kits. An error factor acquisition device includes a first calibrator connected to ports of a network analyzer that has a first state realization unit that determines open-circuit, short-circuit, and standard load states for the ports. Second calibrators connected to the first calibrator and the DUT have a second state realization unit that determines open-circuit, short-circuit, and standard load states for the ports. The first calibrator includes first connection units that connect the ports to the first state realization unit or to the respective second calibrators, while the second calibrators respectively include a second connection unit that connects the ports to the second state realization unit or the DUT.