The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2008
Filed:
Oct. 29, 2004
Akash Bansal, Sunnyvale, CA (US);
Michael Sobelman, Campbell, CA (US);
Simon LI, Sunnyvale, CA (US);
Donald A. Draper, San Jose, CA (US);
Akash Bansal, Sunnyvale, CA (US);
Michael Sobelman, Campbell, CA (US);
Simon Li, Sunnyvale, CA (US);
Donald A. Draper, San Jose, CA (US);
Rambus Inc., Los Altos, CA (US);
Abstract
An integrated circuit device having a test sequence generator, first and second transceivers and a test sequence analyzer. The test sequence generator generates a test data sequence in response to a test mode selection. The first transceiver receives the test data sequence from the test sequence generator and is configured in a loopback mode to transmit and receive the test data sequence. The second transceiver receives the test data sequence received by the first transceiver and is configured in a loopback mode to transmit and receive the test data sequence. The test sequence analyzer determines whether the test data sequence received by the second transceiver matches the test data sequence generated by the test sequence generator.