The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2008

Filed:

Sep. 27, 2004
Applicants:

Takashi Yoneyama, Sagamihara, JP;

Atsuhiro Tsuchiya, Hachioji, JP;

Kenichi Koyama, Sagamihara, JP;

Inventors:

Takashi Yoneyama, Sagamihara, JP;

Atsuhiro Tsuchiya, Hachioji, JP;

Kenichi Koyama, Sagamihara, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microscope system has a stage on which an observation sample, including an observation object and a transparent member, is to be placed. An objective lens is placed to face the observation sample placed on the stage, and a focusing unit moves at least one of the stage and the objective lens to perform a focusing operation. An autofocus unit controls a focusing driving unit by a so-called Through-the-Lens: TTL system. After autofocus is performed for the transparent member by the autofocus unit, the focusing driving unit makes at least one of the stage and the objective lens move by a predetermined constant amount.


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Yoneyama, Takashi. (2008). Microscope system and microscope focus maintaining device for the same (U.S. Patent No. 7345814). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7345814

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