The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2008
Filed:
Oct. 12, 2005
Ronald Gene Filippi, Wappingers Falls, NY (US);
Lynne Marie Gignac, Beacon, NY (US);
Vincent J. Mcgahay, Poughkeepsie, NY (US);
Conal Eugene Murray, Yorktown Heights, NY (US);
Hazara Singh Rathore, Stormville, NY (US);
Thomas M. Shaw, Peekskill, NY (US);
Ping-chuan Wang, Hopewell Junction, NY (US);
Ronald Gene Filippi, Wappingers Falls, NY (US);
Lynne Marie Gignac, Beacon, NY (US);
Vincent J. McGahay, Poughkeepsie, NY (US);
Conal Eugene Murray, Yorktown Heights, NY (US);
Hazara Singh Rathore, Stormville, NY (US);
Thomas M. Shaw, Peekskill, NY (US);
Ping-Chuan Wang, Hopewell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A device, system and method for evaluating reliability of a semiconductor chip are disclosed. Strain is determined at a location of interest in a structure. Failures are evaluated in a plurality of the structures after stress cycling to determine a strain threshold with respect to a feature characteristic. Structures on a chip or chips are evaluated based on the feature characteristic to predict reliability based on the strain threshold and the feature characteristic. Predictions and design changes may be made based on the results.