The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
Mar. 23, 2006
Makoto Shinohara, Tokyo, JP;
Makoto Shinohara, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
To provide a testing apparatus having a function of testing a D/A converter and so forth with a reduced testing time. The testing apparatus tests a converter having functionality of converting an input signal and outputting the signal thus converted. The testing apparatus comprises: a pattern generator which generates an input signal having a predetermined cycle; a clock generator which generates a measurement clock having a predetermined cycle; a measurement unit which receives the measurement clock, and sequentially measures the values of the output signal, synchronously with the measurement clock; and a storage unit which stores, at different corresponding addresses, the values thus sequentially measured by the measurement unit.