The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7342407 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 11, 2008

Filed:

Jan. 31, 2006
Applicants:

Yuji Kuwana, Tokyo, JP;

Yoshiharu Umemura, Tokyo, JP;

Takashi Sekino, Tokyo, JP;

Inventors:

Yuji Kuwana, Tokyo, JP;

Yoshiharu Umemura, Tokyo, JP;

Takashi Sekino, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01); G06F 11/00 (2006.01); H03K 17/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A temperature compensation circuit for effectively compensating the difference of a switching timing due to temperature change of a switching element included in a logic circuit is provided. The temperature compensation circuit includes a temperature detecting section for detecting a value corresponding to the temperature of the switching element, and a correction section for correcting the voltage of a logic signal inputted from a previous circuit to the logic circuit in order to reduce the difference of the switching timing due to the temperature change of the switching element based on the value corresponding to the temperature.


Find Patent Forward Citations

Kuwana, Yuji. (2008). Temperature compensation circuit and testing apparatus (U.S. Patent No. 7342407). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7342407

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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