The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Nov. 29, 2005
Applicants:

Yuan Deng Su, Tainan, TW;

Shean Jen Chen, Jhongli, TW;

Inventors:

Yuan Deng Su, Tainan, TW;

Shean Jen Chen, Jhongli, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention integrates the surface plasmon resonance and common-path phase-shift interferometry techniques to develop a microscope for measuring the two-dimensional spatial phase variation caused by biomolecular interactions on a sensing chip without the need for additional labeling. The common-path phase-shift interferometry technique has the advantage of long-term stability, even when subjected to external disturbances. Hence, the developed microscope meets the requirements of the real-time kinetic studies involved in biomolecular interaction analysis. The surface plasmon resonance microscope of the present invention using common-path phase-shift interferometry demonstrates a detection limit of 2×10refractive index change, a long-term phase stability of 2.5×10π rms over four hours, and a spatial phase resolution of 10π with a lateral resolution of 100 μm.


Find Patent Forward Citations

Loading…