The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Jun. 29, 2006
Applicants:

Suwei Chen, Hillsboro, OR (US);

Derek M. Conrow, Tigard, OR (US);

Aaron K. Martin, El Dorado Hills, CA (US);

Inventors:

Suwei Chen, Hillsboro, OR (US);

Derek M. Conrow, Tigard, OR (US);

Aaron K. Martin, El Dorado Hills, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 5/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

Clock error detections circuits can detect clock duty cycle error and/or quadrature phase error. During an evaluation phase, capacitors are charged. During an evaluation phase, the capacitors are unequally discharged based on the error. A positive feedback mechanism latches the result.


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