The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Feb. 23, 2007
Kim Kee Chow, Bayan Lepas, MY;
Sunil K. Jain, Folsom, CA (US);
Kim Kee Chow, Bayan Lepas, MY;
Sunil K. Jain, Folsom, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
An eye width characterization mechanism determines a pass setting of a sampling phase positioned within an eye width of received data. The sampling phase is incremented in a first direction from the pass setting until the sampling phase is outside the eye width of the received data. The sampling phase is then incremented in an opposite direction of the first direction starting again from the pass setting until the sampling phase is outside the eye width of the received data. The number of the sampling phase increments in the first direction is added to the number of the sampling phase increments in the opposite direction to characterize the eye width of the received data.