The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2008

Filed:

Oct. 14, 2003
Applicants:

Anurag Mittal, Plainsboro, NJ (US);

Nikolaos Paragios, Paris, FR;

Visvanathan Ramesh, Plainsboro, NJ (US);

Antoine Monnet, Paris, FR;

Inventors:

Anurag Mittal, Plainsboro, NJ (US);

Nikolaos Paragios, Paris, FR;

Visvanathan Ramesh, Plainsboro, NJ (US);

Antoine Monnet, Paris, FR;

Assignee:

Siemens Corporate Research, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for dynamic scene modeling and change detection applicable to motion analysis utilizes optical flow for capturing and modeling the dynamics of the scene. Uncertainties in the measurements are evaluated and utilized in order to develop a robust representation of the scene in a higher dimensional space. In another embodiment, a dynamical model of the scene is developed that utilizes multiple past frames to predict the next frame. Incremental methods for updating the model are developed and, towards detection of events, a new measure is introduced that is based on a state-driven comparison between the prediction and the actual observation.


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