The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2008
Filed:
Dec. 23, 2003
Applicant:
Jason Messier, Boston, MA (US);
Inventor:
Jason Messier, Boston, MA (US);
Assignee:
Teradyne, Inc., North Reading, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test system using direct digital synthesis for generation of a spectrally pure, agile clock. The clock is used in analog and digital instruments in automatic test system. A DDS circuit is synchronized to the tester system clock because it is clocked by a DDS clock generated from the system clock. Accumulated phase error is reduced through the use of a parallel accumulator that tracks accumulated phase relative to the system clock. At coincidence points, the accumulated phase in the DDS accumulator is reset to the value in the system accumulator.