The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2008

Filed:

Nov. 08, 2002
Applicants:

Klaus Edinger, Laurel, MD (US);

Ivajlo Rangelow, Baunatal, DE;

Piotr Grabiec, Warsaw, PL;

John Melngailis, Chevy Chase, MD (US);

Inventors:

Klaus Edinger, Laurel, MD (US);

Ivajlo Rangelow, Baunatal, DE;

Piotr Grabiec, Warsaw, PL;

John Melngailis, Chevy Chase, MD (US);

Assignee:

Universitaet Kassel, Kassel, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/72 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a sensor, especially for the probe of a screen probe microscope, for examining probe surfaces () or areas adjacent to the sensor, comprising at least one field effect transistor (FET) made of at least one semiconductor material. The invention also relates to a Hall sensor made of at least one semiconductor material for detecting magnetic fields and whose lateral resolution capacity can be electrically adjusted, in addition to a semiconductor electrode () whose electrode surface can be electrically adjusted.


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