The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2008

Filed:

Oct. 28, 2003
Applicants:

Bernhard Backs, Eching, DE;

Joerg Schaffer, Goettingen, DE;

Lutz Schaefer, Ontario, CA;

Martin Voelcker, Goettingen, DE;

Inventors:

Bernhard Backs, Eching, DE;

Joerg Schaffer, Goettingen, DE;

Lutz Schaefer, Ontario, CA;

Martin Voelcker, Goettingen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/40 (2006.01); G03B 21/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention is directed to a method for improving the depth discrimination in optically imaging systems. It is applicable in particular in light microscopy for improving image quality when examining three-dimensionally extending objects. It is applicable in the method of structured illumination as described in WO 97/6509. For this purpose, influences due to variations in the brightness of the light source, positioning of the imaged periodic structure and bleaching of the object in fluorescence illumination are determined and taken into account in the calculation of the object structure.


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