The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2008
Filed:
Dec. 23, 2003
Applicant:
Jason Messier, Boston, MA (US);
Inventor:
Jason Messier, Boston, MA (US);
Assignee:
Teradyne Inc., Boston, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An automatic test system using a DDS signal generator to create a signal with high spectral purity or a low jitter digital clock. The low jitter clock has variable frequency and is programmed to control other test functions, such as the generation of arbitrary waveforms. The DDS uses a high resolution, high sampling rate DAC to generate a sine wave that is converted to a digital clock. The architecture of the DDS signal generator allows low cost CMOS circuitry to be used to generate the data stream that feeds the high sample rate DAC.