The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2008
Filed:
Jun. 28, 2005
Sunil K. Jain, Folsom, CA (US);
Gregory P. Chema, El Dorado Hills, CA (US);
Sunil K. Jain, Folsom, CA (US);
Gregory P. Chema, El Dorado Hills, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A method of and an apparatus for designing a test environment providing reliable test signal integrity, and of evaluating performance of the test environment and an electronic device during testing of the electronic device. A virtual test environment is created emulating an actual test environment in which the electronic device is to be tested. A virtual calibration of the virtual test environment may be performed, to more closely emulate the actual test environment. A virtual device emulating the actual electronic device is implanted into the virtual test environment, and that virtual device is stimulated with an input test signal emulating the actual input signal that is applied to the actual electronic device in the actual test environment. The integrity of the input test signal and the resulting output signal is evaluated. Based on that evaluation an adjustment might be made to the virtual calibration of the virtual test environment and/or to the virtual device, or both, and the design of the actual device might be improved. The invention can be implemented on a properly programmed general purpose processing system or on a special purpose system.