The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2008
Filed:
Mar. 25, 2004
Richard M. Wasserman, Kirkland, WA (US);
Richard M. Wasserman, Kirkland, WA (US);
Mitutoyo Corporation, Kawasaki-shi, JP;
Abstract
Systems and methods are provided for excluding extraneous image features from inspection operations in a machine vision inspection system. The method identifies extraneous features that are close to image features to be inspected. No image modifications are performed on the 'non-excluded' image features to be inspected. A video tool region of interest provided by a user interface of the vision system can encompass both the feature to be inspected and the extraneous features, making the video tool easy to use. The extraneous feature excluding operations are concentrated in the region of interest. The user interface for the video tool may operate similarly whether there are extraneous features in the region of interest, or not. The invention is of particular use when inspecting flat panel display screen masks having occluded features that are to be inspected.