The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2008

Filed:

Oct. 14, 2005
Applicant:

Patrick Mawet, Snohomish, WA (US);

Inventor:

Patrick Mawet, Snohomish, WA (US);

Assignee:

Mitutoyo Corporation, Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/14 (2006.01); H01F 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An inductive transducer measurement system is provided. A measuring circuit simultaneously drives a plurality of transducer windings and measures their inductance by using a load impedance in an inductance measurement circuit configuration. The system may be designed such that a circuit characteristic that includes a measurement period value, a winding inductance value, and a non-inductive impedance value in series with the winding inductance, is set at a nominal value that suppresses a second harmonic error component that is inherent in the measuring circuit. When a three-phase winding configuration is used, preferred signal processing techniques may be used to cancel third harmonic errors in the system, which in combination with the second harmonic error suppression technique creates a variable inductance measurement system that is relatively free from errors.


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