The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2008
Filed:
Jul. 07, 2006
Yeong-jar Chang, Taichung County, TW;
Kun-lun Luo, Hsinchu, TW;
Jung-chi Ho, Taipei County, TW;
Cheng-wen Wu, Hsinchu, TW;
Chin-jung Su, Taipei, TW;
Yeong-Jar Chang, Taichung County, TW;
Kun-Lun Luo, Hsinchu, TW;
Jung-Chi Ho, Taipei County, TW;
Cheng-Wen Wu, Hsinchu, TW;
Chin-Jung Su, Taipei, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A built-in memory current test circuit to test a memory on a chip is disclosed, comprising a built-in self-test circuit and a dynamic current generation module. The built-in self-test circuit is disposed on the chip to receive and process a test signal and generate a control signal to control operation of the memory and a current control code. The dynamic current generation module, also disposed on the chip, produces a test current into the memory based on the current control code. The current switch time is reduced in the built-in memory current test circuit, and an integrated test combining functional and stress tests can thus be performed.