The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2008
Filed:
Aug. 31, 2006
Sadayuki Matsumiya, Kawasaki, JP;
Shiro Igasaki, Kawasaki, JP;
Masaoki Yamagata, Kawasaki, JP;
Mitutoyo Corporation, Tokyo, JP;
Abstract
Provided are a measuring section () including a vibrating contact-type probe having a measuring force detection circuit () which detects a measuring force acting to the contact portion (); a moving unit (a three-dimensional drive mechanism (), a vertical movement drive mechanism ()) that moves the measuring section () relative to a workpiece surface (S); and a drive control unit () that controls the moving unit based on the magnitude of the measuring force output from the measuring force detection circuit (). The drive control unit () includes: a scanning-measurement control section () that moves for scanning the contact portion along the workpiece surface (S) with the measuring force maintained at the designated scanning measuring force; and a touching-measurement control section () that conducts touching-measurements on the workpiece surface (S) in a repeated manner, in the measurements the contact portion () being adapted to intermittently contact the workpiece surface (S) at a touch detecting measuring force.