The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2008

Filed:

Dec. 19, 2006
Applicants:

Wen LI, Boise, ID (US);

Christopher K. Morzano, Boise, ID (US);

Inventors:

Wen Li, Boise, ID (US);

Christopher K. Morzano, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/04 (2006.01); G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A calibration circuit for calibrating the input data path of a digital circuit is disclosed. A simple string of a repeating data pattern such as, e.g., '1100,' is sent on the data path. The digital circuit captures the data using a clock signal, examines the data signal for the predetermined pattern and adjusts a delay applied to the data signal until the predetermined pattern is recognized. Then the delay is further adjusted until the predetermined pattern is no longer recognized indicating that an edge of the eye of the data is near a clocking edge of the clocking signal. The delay applied to the data signal is then further adjusted by a predetermined amount to position the clock edge near the center of the data eye.


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